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博碩士論文 etd-0615113-120908 詳細資訊
Title page for etd-0615113-120908
論文名稱
Title
複數近場量測系統之實現與應用
Implementation and Application of Complex Near-Field Measurement System
系所名稱
Department
畢業學年期
Year, semester
語文別
Language
學位類別
Degree
頁數
Number of pages
93
研究生
Author
指導教授
Advisor
召集委員
Convenor
口試委員
Advisory Committee
口試日期
Date of Exam
2013-07-04
繳交日期
Date of Submission
2013-07-15
關鍵字
Keywords
相位校正、磁場探針、近場量測、向量網路分析儀、複數近場、遠場、天線
phase calibration, magnetic probe, near-field measurement, vector network analyzer, Complex near field, far field, antenna
統計
Statistics
本論文已被瀏覽 5801 次,被下載 875
The thesis/dissertation has been browsed 5801 times, has been downloaded 875 times.
中文摘要
本論文實現複數近場量測系統與探討其應用。電磁放射體依距離可分為近場與遠場,放射場可以由空間向量組成,每一點位置的訊號皆為複數訊號,複數訊號由振幅及相位組成,即為複數近場。首先建立複數近場量測架構,說明近場量測根據取樣點形成分為三種量測方式且詳細描述其自動化流程,記錄近場振幅及相位資訊的步驟。而後根據IEC 61967-6之附錄A:微帶線法進行磁場探針振幅校正;使用短路時間法或鏈路補償法進行相位的校正,探討系統靈敏度對磁場探針量測結果的影響。接著利用雙端阻抗匹配之50歐姆微帶線驗證複數近場量測系統與有限元素法電磁模擬間結果之符合度及分析其誤差。最後進行矩形微帶天線之複數近磁場量測,利用天線之近場檢測結果分析其製作上的物理尺寸缺陷及不對稱,探討對遠場場型之影響與變化。本論文之複數近場量測系統相較傳統近場量測系統不僅擁有量測振幅的能力,還同時得到相位資訊,取得複數近場資訊可以運用在許多不同領域上,量測能夠達到省時快速、低維護成本、使用空間小等優點。
Abstract
This thesis focuses on the implementation and potential applications of a complex near-field measurement system. The study starts with a brief overview on the near-field measurement methods and describes further details regarding their specific architecture and research direction. In this work, the complex near-field measurement is taken with the help of an automatic scanner. The magnetic probes that are used as sensing devices require calibration prior to a complex magnetic-field measurement. The amplitude calibration is performed based on the microstrip-line method in IEC 61967-6 standard, while the phase calibration is done by either a short-inductance or through-delay compensation method. Measured results for a terminated 50-ohm microstrip line and a rectangular microstrip patch antenna are verified by full-wave simulations. Furthermore, the complex magnetic near-field measurement results for the antenna can be used to predict the influence of manufacturing defects on the far-field radiation pattern. The advantages of the proposed near-field measurement system are time saving, low cost and small space.
目次 Table of Contents
論文審定書 .................................................................................................................... i
誌謝............................................................................................................................... ii
摘要.............................................................................................................................. iii
Abstract ........................................................................................................................ iv
目錄............................................................................................................................... v
圖目錄 ......................................................................................................................... vii
表目錄 ......................................................................................................................... xii
第一章 緒論 ............................................................................................................... 1
1.1 研究背景與技術現況 ................................................................................... 1
1.2 動機目標及技術應用 ................................................................................... 4
1.3 基礎定義 ....................................................................................................... 7
1.3.1 近場與遠場範圍 ................................................................................. 7
1.3.2 空間向量與複數訊號 ......................................................................... 9
1.4 論文章節 ..................................................................................................... 12
第二章 複數近場量測系統及磁場探針校正 ......................................................... 13
2.1 複數近場量測系統 ..................................................................................... 13
2.1.1 系統介紹 ........................................................................................... 14
2.1.2 量測方式 ........................................................................................... 18
2.1.3 自動化流程 ....................................................................................... 21
2.2 磁場探針校正 ............................................................................................. 23
2.2.1 振幅校正 ........................................................................................... 23
2.2.2 相位校正 ........................................................................................... 30
2.3 系統靈敏度 ................................................................................................. 33
第三章 複數近磁場量測與模擬驗證 ..................................................................... 35
3.1 50 Ω 微帶線之複數近磁場量測與模擬驗證 ............................................ 35
3.1.1 散射參數驗證 ................................................................................... 35
3.1.2 複數近磁場驗證 ............................................................................... 36
3.1.3 誤差分析 ........................................................................................... 48
3.2 矩形微帶天線之複數近磁場量測與模擬驗證 ......................................... 50
3.2.1 散射參數驗證 ................................................................................... 50
3.2.2 複數近磁場驗證 ............................................................................... 51
3.2.3 誤差分析 ........................................................................................... 60
3.2.4 天線近場檢測與遠場相關性分析 ................................................... 62
第四章 結論 ............................................................................................................. 67
參考文獻 ..................................................................................................................... 68
附錄一 正規化分析 ................................................................................................. 74
附錄二 近遠場轉換方法 ......................................................................................... 78
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