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博碩士論文 etd-0816107-214633 詳細資訊
Title page for etd-0816107-214633
論文名稱
Title
分數式頻率合成器之量化雜訊抵銷技術與鎖相迴路積體電路實現
Quantization-Noise Cancellation Technique and Phase-Locked Loop IC Design in a Fractional–N Frequency Synthesizer
系所名稱
Department
畢業學年期
Year, semester
語文別
Language
學位類別
Degree
頁數
Number of pages
84
研究生
Author
指導教授
Advisor
召集委員
Convenor
口試委員
Advisory Committee
口試日期
Date of Exam
2007-07-16
繳交日期
Date of Submission
2007-08-16
關鍵字
Keywords
量化雜訊抵銷技術、分數式頻率合成器、差異積分調制器
Fractional-N Frequency Synthesizer, Delta-Sigma Modulator, Quantization Noise Cancellation
統計
Statistics
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The thesis/dissertation has been browsed 5771 times, has been downloaded 4102 times.
中文摘要
在採用差異積分調制器之分數式頻率合成器中,為了提高鎖入速度,則必須增加迴路頻寬,但增加迴路頻寬會引入更多量化雜訊,造成相位雜訊表現變差,因此鎖入時間與相位雜訊表現為取捨的關係。為了研究改善方法,本論文研究量化雜訊抵銷技術,企圖使迴路頻寬增加並且能同時維持好的相位雜訊的表現。研究過程中利用安捷倫公司所研發的模擬軟體ADS來輔助預測量化雜訊抵銷技術對頻率合成器之相位雜訊改善效果。實作部分,本論文實際完成2.6GHz分數式頻率合成器hybrid模組,在使用不同階數之MASH差異積分調制器,並且改變鎖相迴路頻寬條件下量測量化雜訊抵銷技術對相位雜訊之改善效果。論文中也利用台積電0.18μm CMOS製程設計一鎖相迴路晶片,並針對此晶片性能作測試與檢討。
Abstract
For the fractional-N frequency synthesizers using delta-sigma modulation (DSM) techniques, higher PLL bandwidth is highly desirable in order to achieve faster settling time. As the PLL bandwidth is increased, more quantization noises pass through the PLL so that the output phase noise performance is degraded. There is a tradeoff between phase-noise performance and PLL bandwidth. To improve the problem, the thesis studies the quantization noise cancellation technique. With this technique, the PLL bandwidth can be increased without the cost of degrading phase-noise performance. With the help of Agilent EEsof’s ADS, the phase-noise performance of the studied fractional-N frequency synthesizers can be predicted. For demonstration, this research implements a 2.6 GHz fractional-N frequency synthesizer hybrid module, and compares the measured phase noises with and without the technique under considering various combinations of MASH DSM orders and PLL bandwidth. Another demonstration of this thesis is to design a PLL IC using TSMC 0.18 μm CMOS process, and make a discussion on the testing performance of the PLL IC.
目次 Table of Contents
第一章 序論...................................................................................................1
1.1 簡介............................................................................................................. 1
1.2 章節規劃..................................................................................................... 4
第二章 分數式頻率合成器架構與量化雜訊抵銷技術..................................5
2.1 分數式頻率合成器的架構與操作原理....................................................... 5
2.2 採用差異積分調制之分數式頻率合成器................................................... 7
2.2.1 多級雜訊整形架構.......................................................................... 8
2.2.2 單迴路架構................................................................................... 10
2.2.3 非線性效應分析............................................................................ 13
2.3 量化雜訊抵銷技術之理論分析與模擬..................................................... 15
2.3.1 量化雜訊抵銷技術理論分析......................................................... 15
2.3.2 量化雜訊抵銷技術理論模擬......................................................... 18
2.4 運用量化雜訊抵銷技術之分數式頻率合成器軟體輔助模擬.................. 19
2.4.1 系統模擬環境................................................................................ 20
2.4.2 頻率合成器模擬電路之建立......................................................... 21
2.4.3 壓控振盪器行為模型之建立......................................................... 22
2.4.4 差異積分調制器與量化誤差抵銷模擬電路之建立...................... 22
2.4.5 量化雜訊抵銷技術對於相位雜訊之改善..................................... 23
第三章 2.6GHz 鎖相迴路CMOS 電路設計...............................................26
3.1 多模數除頻器........................................................................................... 26
3.1.1 多模數除頻器設計........................................................................ 26
3.1.2 模擬考量與結果............................................................................ 30
3.2 相位頻率偵測器....................................................................................... 32
3.2.1 相位頻率偵測器設計.................................................................... 32
3.2.2 模擬考量與結果............................................................................ 33
3.3 電荷幫浦................................................................................................... 35
3.3.1 電荷幫浦設計................................................................................ 35
3.3.2 模擬考量與結果............................................................................ 36
3.4 壓控振盪器............................................................................................... 38
3.4.1 壓控振盪器設計............................................................................ 38
3.4.2 模擬考量與結果............................................................................ 39
第四章 量化雜訊抵銷技術之實作驗證與鎖相迴路電路晶片之測試........42
4.1 分數式頻率合成器模組之實作................................................................ 42
4.1.1 PE3335 IC 功能簡介..................................................................... 43
4.1.2 被動迴路濾波器之實作................................................................ 44
4.1.3 雙點壓控振盪器之實作................................................................ 45
4.1.4 電壓電流轉換器之實作................................................................ 47
4.1.5 差異積分調制器之實作................................................................ 50
4.2 運用量化雜訊抵銷技術之分數式頻率合成器模組量測.......................... 51
4.3 CMOS 鎖相迴路晶片之量測................................................................... 56
4.3.1 相位頻率偵測器之量測................................................................ 57
4.3.2 電荷幫浦之量測............................................................................ 59
4.3.3 多模數除頻器之量測.................................................................... 62
4.3.4 雙點壓控振盪器之量測................................................................ 63
第五章 結論.................................................................................................65
參考文獻.......................................................................................................66
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