拓樸絕緣體為一種新穎的材料，內部為絕緣性質，而表面受到自旋軌道交互作用的影響其自旋電流不受到材料的缺陷而造成電流的衰減，因此拓樸絕緣體可以藉由表面產生自旋電流的效應，藉以實現量子電腦的願景。本文是針對拓樸絕緣材料Sb2Te3、Sb2Se2Te、Sb2Te2Se、Sb2Se3所做的一系列拉曼光譜與XRD實驗，想藉由探討從拓樸絕緣體Sb2Te3漸漸由Se取代Te的位置；到一般絕緣體Sb2Se3之間的物理特性變化。藉由探測晶體振動模態的拉曼光譜、定性量測成分的能量色散光譜量測(EDS)與晶體結構的XRD實驗，探討拓樸絕緣體到非拓樸絕緣體有何不一致，能使我們對拓樸絕緣體、自旋電子學有更近一步的認識。

Topological insulator with its insulating interior is a novel material. The spin current on the surface of the material is not affected by the material defects and the collisions between particles which will produce current decay. Therefore, topological insulators can be used to control the spin current to achieve the vision of the quantum computer in the future.
In this work, we investigate four Sb-based topological insulating materials of Sb2Te3, Sb2Se2Te, Sb2Te2Se, and Sb2Se3. We made a series of Raman spectroscopy and XRD experiment. We can measure vibration modes crystal by Raman spectroscopy、components measured by energy dispersive spectroscopy (EDS), and crystal structure by x-ray diffraction (XRD) experiments. From the above experiments, we can investigate the possible changes from topological insulator to non-topological insulator. We can closely understand the topological insulator material and spintronics.

論文審定書
誌謝 i
中文摘要 ii
ABSTRACT iii
目錄 iv
圖目錄 vi
表目錄 ix
Chapter 1 導論 1
1.1 介紹 1
1.2 霍爾效應 3
1.3 鉍基化合物系列回顧 8
Chapter 2 量測系統與原理介紹 15
2.1 場發型掃描式電子顯微鏡 Field emission scanning electron microscopy (FESEM) 15
2.2 能量色散光譜Energy-dispersive x-ray spectroscopy (EDS) 18
2.3 x射線繞射 x-ray diffraction (XRD) 20
2.4 拉曼光譜儀 21
Chapter 3 樣品介紹與處理 23
3.1 樣品介紹 23
3.2 粉末XRD實驗樣品處理 27
Chapter 4 實驗結果與討論 28
4.1 能量散射光譜 28
4.2 粉末XRD 數據分析 36
4.3 拉曼光譜分析 44
Chapter 5 結論 57
Chapter 6 附錄 58
參考文獻 63

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