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論文名稱 Title |
使用扭轉向列型液晶測量氧化鋅m平面及c平面之反射異向性光譜 Measurement of reflectance anisotropy spectroscopy of m-plane and c-plane zinc oxide semiconductor by using twisted nematic liquid crystals |
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系所名稱 Department |
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畢業學年期 Year, semester |
語文別 Language |
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學位類別 Degree |
頁數 Number of pages |
31 |
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研究生 Author |
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指導教授 Advisor |
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召集委員 Convenor |
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口試委員 Advisory Committee |
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口試日期 Date of Exam |
2013-06-26 |
繳交日期 Date of Submission |
2013-07-18 |
關鍵字 Keywords |
反射異向性光譜、扭轉向列型液晶液晶、氧化鋅 Zinc Oxide, reflectance anisotropy spectroscopy, TN liquid crystals |
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統計 Statistics |
本論文已被瀏覽 5695 次,被下載 0 次 The thesis/dissertation has been browsed 5695 times, has been downloaded 0 times. |
中文摘要 |
我們利用扭轉向列型液晶(twisted nematic liquid crystals; TN LCs)測量c平面及m平面氧化鋅樣品之反射異向性光譜(reflectance anisotropy spectroscopy; RAS),此實驗設置是參考Aspnes在1988年所提出之架構(D. E. Aspnes, J. P. Harbison, A. A. Studna and L. T. Florez, Appl. Phys. Lett. 52, 957, 1988),我們可利用此量測方法來判斷氧化鋅樣品為c平面或m平面。最後我們還可以根據其光譜訊號之強度大小再配合上A、B、C三種激子的躍遷能量位置以及強度差異之正負號和大小來判斷m平面樣品c軸的方向。 |
Abstract |
Twisted nematic liquid crystals were used to measure reflectance anisotropy spectroscopy of m-plane and c-plane ZnO bulks. This experimental setup was based on Aspnes’s experimental setup in 1988 (D. E. Aspnes, J. P. Harbison, A. A. Studna and L. T. Florez, Appl. Phys. Lett. 52, 957, 1988). Whether the ZnO samples were c-plane or m-plane oriented can be determined by using this measurement. Finally, the direction of c-axis of the m-plane sample can also be determined. |
目次 Table of Contents |
目錄 論文審定書 i 致謝 ii 摘要 iii Abstract iv 圖表目錄 vi 第1章 前言 1 第2章 反射異向性光譜 2 2-1 反射異向性光譜簡介 2 2-2 反射異向性光譜之原理 3 2-3 反射異向性光譜之系統架設 8 第3章 樣品與實驗裝置 10 3-1 氧化鋅簡介 10 3-2 使用扭轉向列型液晶測量反射異向性光譜之實驗架構 13 第4章 實驗結果 17 第5章 結論 21 參考文獻 22 |
參考文獻 References |
[1] Ya. I. Alivov and J. E. Van Nostrand, Appl. Phys. Lett. 83, 14 (2003) [2] Annabel Wood, Michael Giersig, Michael Hilgendorff, Augst. J. Chem, 56, 1051-1057 (2003) [3] Y. Chen, N. T. Tuna, Y. Segawa, H. Ko, S. Hong and T. Yao, Appl Phys. Lett. 78, 1469 (2001) [4] C. Kittel, Introduction of Solid State Physics, 7th ed, John Wiley & Sons inc., New York (1997).R. N. Bhattacharya, H. Shen, P. Paraynthal, F. H. Pollak, T. Coutts, and H. Aharoni, Phys. Rev. B 37, 4044 (1988) [5] J. P. Harbison, D. E. Aspnes, A. A. Studna and L. T. Florez, J. Vac. Sci. Technol. B 6, 740 (1988) [6] D. E. Aspnes, J. P. Harbison, A. A. Studna and L. T. Florez, Appl. Phys. Lett. 52, 957 (1988) [7] D. E. Aspnes, J. P. Harbison, A. A. Studna and L. T. Florez, J. Vac. Sci. Technol. A 6, 1327 (1988) [8] C. Jagadish and S. J. Pearton, Zinc Oxide Bulk, Thin Films and Nanostructures, 1st ed, Elsevier Ltd. All rights reserved (2006) [9] S. OZAKI, T. MISHIMA, and S. ADACHI, Jpn. J. Appl. Phys. Vol. 42, 5465 (2003) [10] A. Mang, K. Reimann, and S. Rübenacke, BAND GAPS, CRYSTAL-FIELD SPLITTING, SPIN-ORBIT COUPLING, AND EXCITON BINDING ENERGY IN ZnO UNDER HYDROSTATIC PRESSURE, Solid State Commun. 94, No.4 (1995) [11] U.RÖSSLER†, Energy Bands of Hexagonal 2-6 Semiconductors, Phy. Rev. Vol.184, Number1 (1969) [12] D. C. Reynolds, D. C. Look, B. Jogi, C. W. Litton, G. Cantwell and W. C. Harsch, Phys. Rev. B 60, 2340 (1999) [13] D. J. Tomas: J. Phys. Chem. Solids 15, 86 (1960) [14] D. G. Tomas and J. J. Hopfield: Phys. Rev. 116, 573 (1959) [15] J. J. Hopfield: J. Phys. Chem. Solids 15, 97 (1960) [16] Y. H. Chiang, D. P. Wang, “Using contactless electroreflactance spectroscopy with polarization of probe light parallel and perpendicular to c-axis to study m-plane ZnO transition mechanism,” Mastre thesis, Department of Physics, National Sun Yat-Sen University, Kaohsiung, 80424, Taiwan (2011) |
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