Responsive image
博碩士論文 etd-0626101-181134 詳細資訊
Title page for etd-0626101-181134
論文名稱
Title
以有機金屬化學氣相沉積成長氮化鎵系列之研究
The study of GaN films grown by Metal Organic Chemical Vapor Deposition system
系所名稱
Department
畢業學年期
Year, semester
語文別
Language
學位類別
Degree
頁數
Number of pages
55
研究生
Author
指導教授
Advisor
召集委員
Convenor
口試委員
Advisory Committee
口試日期
Date of Exam
2001-06-19
繳交日期
Date of Submission
2001-06-26
關鍵字
Keywords
氮化鎵、化學氣相沉積
MOCVD, GaN
統計
Statistics
本論文已被瀏覽 5671 次,被下載 0
The thesis/dissertation has been browsed 5671 times, has been downloaded 0 times.
中文摘要
在本論文中,我們利用有機金屬化學氣相沈積法在藍寶石基板上成長無摻雜氮化鎵薄膜和矽摻雜氮化鎵薄膜。我們以調整氫氣流量及氮化時間來探討對無摻雜氮化鎵薄膜之影響。以及探討升溫速率、Si2H6流量大小和無摻雜氮化鎵薄膜厚度對矽摻雜氮化鎵之影響。在無摻雜氮化鎵實驗裡,當氫氣量加大時,會減少碳的污染,使薄膜特性變好。氮化時間太長或太短會使薄膜特性變差。在矽摻雜氮化鎵實驗中,升溫速率太快或太慢都會使薄膜特性變差。Si2H6流量和載子濃度成很好線性關係,Si2H6流量達到7.19nmol/min後,電子移動率不會再增加。在成長矽摻雜氮化鎵之前預成長無摻雜氮化鎵薄膜會改善矽摻雜氮化鎵結晶品質,而且會影響矽摻雜氮化鎵的光特性例如PL光譜。



Abstract
In this thesis, we grew undoped GaN and Si-doped GaN films on sapphire by metal organic chemical vapor deposition (MOCVD) system. For the purpose to investigate the influences of undoped GaN films, we modulated H2 gas flow rate and nitridation time in the undoped GaN growth conditions. The ramping rate, Si2H6 flow rate and undoped GaN film thickness were varied to study the influences on Si-doped GaN films. When H2 gas flow rate was increased, it led to carbon pollution reduced and improved films quality. Too long or too short nitridation time would change film qulity seriously. In the Si-doped GaN films growth, the films quality become worse when the ramping rate was too quick or too slow. The relationship between the carrier concentration of Si-doped GaN films and Si2H6 flow rate was linear. The electron mobility of Si-doped films will not increase apparently until Si2H6 flow rate up to 7.19nmol/min . Undoped GaN film which was pregrown before Si-doped GaN could improve the crystal quality of Si-doped GaN films, and it will influence the optical properties of Si-doped GaN film, such as PL spectra.
目次 Table of Contents
第一章 簡介………………………………………………………1
1.1 以MOCVD成長氮化鎵之基本化學反應………………… 2
1.2 Buffer layer的作…….……………………………… 2
1.3 N型摻雜GaN………………………………………………3
1.4 P型摻雜GaN………………………………………………3
第二章 MOCVD系統與量測設備………………………………… 4
2.1 有機金屬化學氣相沉積系統………………………… 7
2.2 PL(Photoluminescence)…………………………… 9
2.3 MOCVD系統自動化程式………………………………… 10
2.4 薄膜厚度量測設備………………………………………11
第三章 以MOCVD成長無摻雜氮化鎵…………………………… 23
3.1 基板準備……………………………………………… 23
3.2 氫氣實驗磊晶流程…………………………………… 25
3.3 結果與討論…………………………………………… 25
3.4 氮化實驗磊晶流程…………………………………… 28
3.5 結果與討論…………………………………………… 28
第四章 以MOCVD成長N型摻雜氮化鎵………………………… 41
4.1 基板準備……………………………………………… 41
4.2 無摻雜GaN上長N型GaN實驗磊晶流程………………… 42
4.3 結果與討論…………………………………………… 42
4.4 升溫速率對N型GaN的影響實驗磊晶流程…………… 45
4.5 結果與討論…………………………………………… 46
4.6 N型GaN成長實驗磊晶流程…………………………… 47
4.7 結果與討論…………………………………………… 47
第五章 結論…………………………………………………… 60
參考資料 ………………………………………………………… 59

參考文獻 References
1. S. Nakamura and G. Fasol, “The Blue Laser Diode”,13(1997)

2. S. Nakamura,T. Mukai, and M. Senoh,Appl. Phys. Lett. 64, 1687(1994)

3. T. Mukai,D. Morita, and S. Nakamura, J. Cryst. Growth 189/190,778(1998)

4. T. Mukai, H. Narimatsu, and S. Nakamura,Jpn. J. Appl. Phys.,Part 2 37,L479(1998)

5. Bernard Gil, “Group III Nitride Semiconductor Compounds”,33(1997)
6. 史光國,工業材料,第160期,89年4月,p173.
7. A. Amano, M. Kito, K. Hiramatsu, and I. Akasaki, Jpn. J. Appl. Phys.
28,L2112(1989)

8. D. Kapolnek, X. H. Wu,B. Heying,S. Keller,B. P. Keller,U. K.
Mishra,S. P. Benbaars and J. S. Seck,Appl. Phys. Lett.,67,L1541(1995)

9. S. D. Lestes,F. A. Poice,C. G. Crafor and X. A. Steigerwald,Appl. Phys. Lett.,66,L1249(1995)

10. S. Nakamura,S. Masayuki,and H. Takashi,Jpn. Appl. Phys.,30,L1708(1991)
11. 王國榮,新觀念的Visual BASIC 6.0教本,旗標出版
12. 王國榮,Visual BASIC 6.0實戰講座,旗標出版
13. 洪錦魁,精通Visual BASIC 6.0中文版,文魁資訊
14. 彭明柳,Visual BASIC 6.0中文專業版徹底研究,博碩文化
15. H. M. Mansatvit, and W. I. Simpson, J. Electrochem. Soc,116,
1725(1969)

16. Bo Monemar, J. Cryst. Growth 189, 1, 1998

17. N. Grandjean, J. Massies and M. Leroux, Appl. Phys. Lett., 69,2071(1996)

18. L. T. Romano,T. H. Cyers, Appl. Phys. Lett. ,71,3486(1997)

19. T. Ogino,and M. Aoki,Jpn. J. Appl. Phys. 19,2395(1980)

20. J. Neugebauer,and C. G. Van de Walle,Appl. Phys. Lett. 69,503(1996)

21. T. Suski,P. Perlin,H. Teisseyre,M. Leszczynski, I. Grzegory,J. Jun, M.Bockowski,S. Porowski, and T. D. Moustakas, Appl. Phys. Lett. 67,2188(1995)

22. G. Li S. J. Chua,S. J. Xu,W. Wang,P. Li,B. Beaumont,and P. Gibart,Appl. Phys. Lett. 74,2821(1999)

23. L. W. Tu,Y. C. Lee,S. J. Chen,I. Lo,D. Stocker,and E. F. Schubert,Appl. Phys. Lett. 73,2802(1998)

24. J. N. Kunnia,M. A. Khan, and D. T. Olson, J. Appl. Phys. 73,4700(1993)

25. C. F. Lin, G.C. Chi,M.S. Feng, J. D. Guo,J. S. Tsang, and J. M. Hong,Appl. Phys. Lett. 68,3758(1996)

26. S. Keller, D. Kapolnek, B.P. Keller, Y. Wu, B. Heying, J. S. Speck,U. K. Mishra,and S. P. DenBaars,Jpn. J. Appl. Phys. 35,L285(1996)

27. A. E. Wickenden, D. K. Wickenden and T. J. Kistenmacher, J. Appl. Phys. 75,5367(1994)


電子全文 Fulltext
本電子全文僅授權使用者為學術研究之目的,進行個人非營利性質之檢索、閱讀、列印。請遵守中華民國著作權法之相關規定,切勿任意重製、散佈、改作、轉貼、播送,以免觸法。
論文使用權限 Thesis access permission:校內校外均不公開 not available
開放時間 Available:
校內 Campus:永不公開 not available
校外 Off-campus:永不公開 not available

您的 IP(校外) 位址是 18.224.0.25
論文開放下載的時間是 校外不公開

Your IP address is 18.224.0.25
This thesis will be available to you on Indicate off-campus access is not available.

紙本論文 Printed copies
紙本論文的公開資訊在102學年度以後相對較為完整。如果需要查詢101學年度以前的紙本論文公開資訊,請聯繫圖資處紙本論文服務櫃台。如有不便之處敬請見諒。
開放時間 available 已公開 available

QR Code