光致電流顯微術已經被廣泛的應用在半導體元件及積體電路上，近而我們創新應用於有機光電元件的量測上，在本實驗中我們用來量測有機光電元件的反應時間，在極短的反應時間裡，我們可以擁有很高的空間解析度，透過雷射、雷射共焦掃描顯微鏡和RF Lock-in Amplifier等儀器，以及利用飛行時間式電荷傳導量測系統(Time-of-Flight)，除了可以量測之前無機半導體元件的特性外，我們也已經成功的量測計算出有機半導體元件的漂移速率(drift velocity)，對於有機元件的量測技術而言，是一大突破。
本實驗所使用的雷射是經由共焦掃描顯微鏡後打在樣品的主動區上，所以激發的範圍由掃描區域大小決定，不同於以往的量測方法，我們所求得半導體的漂移速率具有面的特性，可以對半導體上一整個面作時間的解析，藉此瞭解載子在半導體上的傳輸特性。

We have successfully implemented the time-resolved technique at frequency domain on a laser scanning microscope. The method is implemented via interfacing a lock-in amplifier with the laser scanning microscope and is used to investigate organic photonic devices (OPD). The available modalities include electroluminescence and optical beam induced current. In this way, temporal response of a device can be investigated at high spatial resolution.
Despite of its now limited role in flat panel display, OPD presents as a versatile material with numerous potentials, with solar power panel as the most noted one recently. The investigation conducted enables us to better understand the fundamental dynamics of carriers unique to OPDs.

第一章 實驗導論

第二章 時間解析之光致電流原理
2.1 光致電流的原理
2.2 DC OBIC, RF OBIC & Time-resolved OBIC
2.3 RF訊號量測原理
2.4 飛行時間式電荷傳導系統原理

第三章 實驗架設與儀器介紹
3.1 OBIC光路與電子線路圖
3.2雷射光源
3.3共焦掃描顯微系統
3.4低噪音前至放大器(Low-noise Preamplifier)
3.5鎖相放大器(Lock-in Amplifier)

第四章 實驗結果及數據分析
4.1 實驗簡介
第一部份：更改chopper頻率以觀察solar cell相位之
變化
4.2樣品介紹
4.3 DC OBIC影像
4.4 Time-Resolved OBIC影像

第二部份：固定chopper頻率但更改偏壓以觀察solar cell相位之變化
4.5樣品介紹
4.6 DC OBIC影像
4.7 Time-resolved OBIC影像

第五章 結論與未來展望
5.1 結論
5.2 未來展望

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