本篇論文主要分為兩部分：其一是提出一套設計、製作各式數位化條紋圖案的方法。由於投影條紋式的三維形貌量測技術，其量測精準度受限於投影條紋的成像品質，因此本篇文提出製作各式條紋圖案的方法。改進單頻條紋的設計、並且設計雙頻式的條紋，以進一步解決斷層面上的問題。本篇論文亦設計二維的條紋圖案，可應用於影像融合技術。各式條紋圖案主要的優點是提高條紋的準確度、對比度以及較低的扭曲的程度。
論文之另一部分是把設計的雙頻式投影條紋，應用於投影條紋式的三維形貌量測技術。可輕易解決待測物的斷面問題，並針對待測物斷層的區域做分析，並討論其結果。

A novel accurate calibration-based phase-shifting projected fringe profilometry (Calibration-based PSPFP) for finding the absolute shape of objects is proposed. In addition to a tremendous savings in time, the benefits of using Calibration-based PSPFP also include greatly reduced environmental vulnerability.

Since Calibration-based PSPFP employs a sinusoidal fringe pattern to perform the phase-shifting algorithm, the quality and accuracy of the sinusoidal fringe pattern becomes critical. To evaluate the performance of this measurement scheme and reduce the phase error caused by projected fringes, fabrication of various digital sinusoidal fringe patterns is necessary. Thus, we propose a method to fabricate various digital patterns. Application of a 2-D fringe pattern for Calibration-based PSPFP is proposed as well.

誌謝…………………………………………………………Ⅰ
摘要…………………………………………………………Ⅱ
目次…………………………………………………………Ⅲ
圗目次………………………………………………………Ⅴ
表目次………………………………………………………Ⅷ

第一章. 前言………………………………………………1
1.1 歷史背景………………………………………………1
1.2 動機與目標……………………………………………3

第二章. 基本原理…………………………………………5
2.1.1 光罩設計原理………………………………………5
2.1.2 快速傅立葉轉換與校正……………………………7
2.1.3 相位展開與相位展開演算法………………………10
2.1.4 結語…………………………………………………12

第三章. 雙頻式投影條紋實驗架構………………………13
3.1 各種光罩設計………………………………………13
3.1.1 單頻投影條紋………………………………………13
3.1.2 雙頻投影條紋………………………………………14
3.1.3 二維單頻投影條紋…………………………………17
3.2 量測系統架構與校正步驟…………………………20
3.3 結語…………………………………………………22

第四章. 實驗結果…………………………………………25
4.1 條紋分析………………………………………………25
4.2 雙頻條紋投影待測物體量測…………………………26

第五章. 結論與未來展望…………………………………29
5.1 結論……………………………………………………29
5.2 未來與展望……………………………………………30

參考文獻……………………………………………………31

參考文獻

1.K. A. Haines, B. P. Hildebrand, “Contour generation by wavefront reconstruction,” Physica Letters, 19, 10-11 (1965).
2.Takeda, “Fourier transform profilometry for the automatic measurement of 3-D object shaped,” Applied Optics, 22, No. 24, 3977-3982 (1983).
3.K. Creath, “Phase-measurement interferometry techniques,” Progress in Optics, 26, p. 350-393, E. Wolf, ed., North Holland, Amsterdam (1988).
4.V. Srinivasan, H. C. Liu, and M. Halioua, “Automated phase-measuring profilometry of 3-D diffuse objects,” Applied Optics, 23 (18), 3105-3108 (1984).
5.V. Srinivasan, H. C. Liu, and M. Halioua, “Automated phase-measuring profilometry: a phase mapping approach,” Applied Optics, 24(2), 185-188 (1985).
6.V. Y. Su, G von Bally, and D. Vukicevic, “Phase-stepping grating profilometry: utilization of intensity modulation analysis in complex objects evaluation,” Optical Communications, 98, 141-150 (1993)
7.Guowen Lu, Shudong Wu, N. Palmer, and Hongyu Liu, “Application of phase-shift optical triangulation to precision gear gauging,” Proc. SPIE, 3520, 52-63 (1998).
8.Hongyu Liu, Wei-Hung Su, Karl Reichard, and Shizhuo Yin, “Calibration-based phase-shifting projected fringe profilometry for accurate absolute 3D surface profile measurement,” Optics Communications, 216, Issues 1-3, February 1, 2003, p.65-80.
9.Wei-Hung Su, Hongyu Liu, Karl Reichard, Shizhuo Yin, and Francis T. S. Yu, “Fabrication of digital sinusoidal gratings and precisely conytolled diffusive flats and their application to highly accurate projected fringe profilometry,” Optical Engineering, 42( 6), 1730-1740 (2003).
10.K. G. Larkin and B. F. Oreb, “Design and assessment of symmetrical phase-shifting algorithms,” J. Opt. Soc. Am. A9, 1740-1748 (1992).
11.Y. Surrel, “Phase stepping: a new self-calibrating algorithm,” Applied Optics, 32, 3598-3600 (1993).
12.K. Hibino, B. F. Oreb, D. I. Farrant, and K. G. Larkin, “Phase shifting for nonsinusoidal waveforms with phase-shift errors,” ” J. Opt. Soc. Am. A12, 761-768 (1995).
13.K. Creath, “Step height measurement using two-wavelength phase-shifting interferometry,” Applied Optics, 26 (14), 2810-2816 (1987).
14.H. Zhao, W. Chen, and Y. Tan, “Phase-unwrapping algorithm for the measurement of three-dimensional object shapes,” Applied Optics, 33, 4497-4500 (1994)
15.Jie-Lin Li, Hong-Jun Su, and Xian-Yu Su, “Two-frequency grating used in phase-measuring profilometry,” Applied Optics, 36 (1), 277-280 (1997).
16.Kosuke Sato and Seji Inokuchi, “Three-dimensional surface measurement by space encoding range image,” Journal of Robotic Systems, 2, 27-39 (1985).
17.G. Sansoni, S. Corini, S. Lazzari and F. Docchio, “Three-dimensional imaging based on Gray-code light projection: characterization of the measuring algorithm and development of a measuring system for industrial applications,” Applied Optics, 36 (19) 4463-4469 (1997).
18.Wei-Hung Su, Karl Reichard, Hongyu Liu, and Shizhuo Yin, “Integration of segmented 3D profiles measured by calibration-based phase-shifting projected fringe profilometry (PSPFP),” Optical Memory & Neural Networks, 12 (1), (2003).
19.自動化光學檢測市場及技術發展趨勢調查 張振堉 金美敬 林耀明 工研院經資中心出版 (2002)
20.Jie-Lin Li,Hong-Jun Su,and Xian-Yu Su,“Two-frequency grating used in phase-measuring profilmetery” APPLIED OPTICAL,36(1),(1997)
21.Wei-Hung Su,Cho-Yo Kuo, and Shizhuo Yin “Design and fabrication of various digital fringe patterns for projected fringe profilometry” Optical Memory & Neural Networks
22.D. C. Ghiglia, G. A. Mastin, and L. A. Romero, “Cellular automata method for phase unwrapping,” J. Opt. Soc. Am. A 4,267–280 ~1987!.