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博碩士論文 etd-0723107-232951 詳細資訊
Title page for etd-0723107-232951
論文名稱
Title
利用時間解析電致發光顯微術研究阻抗匹配對發光二極體之影響
Investigating the effect of impedance matching on LED with Time-resolved Electro-luminescence Microscopy
系所名稱
Department
畢業學年期
Year, semester
語文別
Language
學位類別
Degree
頁數
Number of pages
67
研究生
Author
指導教授
Advisor
召集委員
Convenor
口試委員
Advisory Committee
口試日期
Date of Exam
2007-06-20
繳交日期
Date of Submission
2007-07-23
關鍵字
Keywords
發光二極體、時間解析、電致發光
LED, time-resolved, electroluminescence
統計
Statistics
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中文摘要
隨著發光二極體技術的發展,其應用的領域亦隨之有更多元的發展,高亮度發光二極體為量測螢光半衰期的激發光源有了新的選擇,本實驗透過共焦掃描顯微鏡、鎖相放大器等儀器,可以在短時間內取得高空間解析度之時間解析電致發光影像,觀測發光二極體在高頻驅動下的性質,並以阻抗匹配的方式將高頻下寄生電容的效應減輕,使發光二極體可以在更高的頻率下以更好的發光強度。
Abstract
As the great studies have been made in light emitting diodes, the application becomes more variety for different field. High bright light emitting diodes apply a new light source for fluorescence lifetime measurements. We use confocal scanning microscopy and a high frequency sensitive lock-in amplifier to obtain the electroluminescence image at ten of micrometer. We drive the light emitting diodes by radio frequency signal and observe it. We parallel connection an inductance to match the parasitic capacity in high frequency to obtain better light emitted brightness.
目次 Table of Contents
第一章 導論 01
第二章 實驗原理 04
2.1 電致發光的原理 04
2.2 激發光源之時間與空間同調性 05
2.3 PN接面的寄生電容與影響 07
2.4 RF訊號量測原理 12
第三章 實驗架設與儀器介紹 14
3.1 實驗架設 14
3.2實驗設備 15
3.2.1 光電倍增管 15
3.2.2 針孔 16
3.2.3 低噪音電流前置放大器 17
3.2.4 鎖相放大器 18
第四章 實驗結果及數據分析 20
4.1 樣品介紹 20
4.2直流放大之電致發光影像 21
4.3 寄生電容的量測 25
4.4 以電感並聯之直流放大電致發光影像 27
4.5 射頻放大之電致發光影像 35
第五章 結論 40
參考資料 41
參考文獻 References
[1] Yan-Kuin Su, Chun-Lian Lin, Development of Light Emitting Diode, Post Dr. in Department of Electrical Engineering, NCKU
[2] J. Shakya, J. Y. Lin, and H.X. Jian, Time-resolve electroluminescence studies of III-nitride ultraviolet photonic-crystal light emitting diodes,K
[3] Eugene Hecht, Optics, page 390,391,571,572,573
[4] F.J. Kao, M.K. Huang and Y.S. Wang, Two-photon optical beam induced current imaging of indium nitride blue light-emitting diodes, OPTICS LETTERS, Vol.24,No.20,P1410-1499, 1999
[5]F. J. Kao, J. C. Chen, S. C. Shih and A. Wei, Optical beam induced current microscopy at DC and Radio Frequency, Optics Communication, Optics Communication, in press
[6]J. E. Hulse, K. Sarault N. L. Rowell, M. Simard-Normandin, J. A. Bardwell, Time-resolved electroluminescence measurement on GaAs and GaN device, 2006
[7]M. Shatalov, A. Chitnis, V. Mandavilli, R. Pachipulusu, J. P. Zhang, V. Adivarahan, Time-resolved electroluminescence of AlGaN-based LEDs with emission at 285nm, 2002
[8]M. Pophristic, F.H. Long,C. Tran, I. T. Ferguson, and R. F. Karlicek, Jr. time-resolved photoluminescence measurements of InGaN light-emitting diodes,1998
[9]Stefanos Sidiropoulos and Mark Horowitz, Current Integrating Receivers for High Speed System Interconnects, IEEE 1995 custom integrated circuit conference
[10] T.Wilson and C.J. R. Sheppard, Theory and Practice of Scanning Optical Microscopy, Academic, New York, 1984
[11] B. P. Richards and P.K.footner, The Role of Microscopy in Semiconductor Failure Analysis, Oxford U. Press, New York, 1992
[12] Seigo Ito and Hideo Monma, Failure Analysis of Wafer using Backside OBIC Method, FUJITSU LIMITED, Japan, 1998
[13] Sheng-Feng Lee, Tzyy-Feng Horng, Design and Implementation of 2.4GHz Two-Point Voltage-Controlled Oscillators on a Multilayer LTCC subtrate with Embedded Inductors and Capacitors. NSYSU, Taiwan, 2003
[14] Fu-Jen Kao, Yu-Chi Liao , Time-resolved Optical Beam Induced Current Microscopy, NSYSU, Taiwan, 2006
[15]翁鵬翔, 應用時間解析之電致發光及光致電流顯微術於光電元件, 國立中山大學光電工程研究所碩士論文, 民國94年
[16]黃茂闊, 雙光子共焦顯微鏡和顯微光譜之應用:GaInN發光二極體的光致電流影像和顯微光譜, 國立中山大學光電工程研究所碩士論文, 民國89年
[17]莊惠如、林福林、陳宜隆、李亮輝, 射頻微波通訊之量測及儀器介紹, 科儀新知第廿三卷第三期90.12
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