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博碩士論文 etd-0804111-182558 詳細資訊
Title page for etd-0804111-182558
論文名稱
Title
同色度玻璃螢光體與矽膠色轉換層之可靠度實驗暨壽命預測
The Study of Lifetime Prediction and Reliability Test of Co-Chromaticity Glass and Silicone Phosphor
系所名稱
Department
畢業學年期
Year, semester
語文別
Language
學位類別
Degree
頁數
Number of pages
91
研究生
Author
指導教授
Advisor
召集委員
Convenor
口試委員
Advisory Committee
口試日期
Date of Exam
2011-06-27
繳交日期
Date of Submission
2011-08-04
關鍵字
Keywords
加速壽命測試、韋伯分佈、玻璃螢光體、平均失效時間、阿瑞尼斯方程式
glass phosphor, MTTF, Arrhenius equation, accelerate life test, Weibull distribution
統計
Statistics
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The thesis/dissertation has been browsed 5781 times, has been downloaded 947 times.
中文摘要
本研究使用玻璃轉換溫度 (Tg=750℃) 較高的玻璃材料取代目前商用矽膠(Tg=150℃)作為白光調和螢光粉的色轉換層基材,稱為玻璃螢光體。玻璃的轉換溫度較矽膠高上許多,同時保有玻璃的特性以及螢光粉的發光能力,對溫度的穩定性良好以及對濕度的阻絕性佳。
本研究設計一項加速壽命測試,以150℃、200℃以及250℃三種溫度展開流明衰減、色飄移、色溫差、穿透度與螢光光譜的量測,並得到在最高溫度250℃下,玻璃與矽膠螢光體的流明衰減分別為8.15%與38.85%;色飄移分別為1.07與7.32的變化量;色溫差分別為856K與3666K的改變;穿透率衰減分別為4.21%與 28.1%的衰減量;螢光光譜下玻璃與矽膠螢光體的激發與放光則無太大改變。
經過老化測試後,將進一步探討平均失效時間。並利用韋伯分佈(Weibull)與阿瑞尼斯(Arrhenius)方程式進行失效率之運算,並推演平均失效時間(MTTF)。此時先定義失效為:當流明衰減至初始狀態之90%,稱之為失效。推演結果顯示玻璃螢光體之平均失效時間在150℃、200℃與250℃下是矽膠螢光體的4.8、5.9與 7.5倍。
實驗的結果顯示,相較於矽膠螢光體,玻璃螢光體在流明損失、色飄移以及平均失效時間的計算中,展示優異的熱穩定特性。具有較佳熱穩定特性的玻璃螢光體應用在填充材料中,相信將有廣泛的使用空間,期許在未來LED模組與高功率高可靠度的追求中,可以嶄露頭角。
Abstract
A Ce:YAG-doped glass phosphor layer instead of conventional Ce:YAG-doped silicone phosphor layer as phosphor-converted white-light emitting diodes (PC-WLEDs) is demonstrated. The advantage of employing doped glass encapsulation in high power PC-WLEDs could be explained the material property of glass transition temperature of 750℃ was higher than silicone of 150℃.
The lumen degradation, chromaticity shift, color temperature change, transmittance, and fluorescence spectrum in glass and silicone based high-power PC-WLEDs under thermal aging at 150℃, 200℃, and 250℃ is compared and presented. Under highest temperature of 250℃, the glass and silicone encapsulation base d PC-WLEDs exhibited 8.15% and 38.85% in lumen loss, 1.07 and 7.32 in chromaticity shift, 856 K and 3666 K in color temperature change, 4.21% and 28.1% in transmittance loss, respectively. However, the excitation spectrum altered as slight as emission spectrum before and after experiments.
After aging test, the mean-time-to-failure (MTTF) evaluation of glass and silicone encapsulation materials for PC-WLEDs in accelerated thermal tests is also compared and presented by the using of Weibull distribution and Arrhenius equation. The MTTF of PC-WLEDs is defined the lumen decayed to 90%. The results showed that the glass as encapsulation material of PC-WLEDs exhibited higher MTTF than the silicone encapsulation by about 4.81, 5.92, and 7.53 times in lumen loss at 150℃, 200℃, and 250℃, respectively.
The results of the lumen loss, chromaticity shift, and MTTF investigations demonstrated that the thermal-stability performance of the glass based PC-WLEDs were better than silicone based PC-WLEDs at 150℃, 200℃, and 250℃. A better thermal stability phosphor layer of glass as encapsulation material may be beneficial to the many applications where the LED modules with high power and high reliability are demanded.
目次 Table of Contents
目錄
致謝 i
中文摘要 iii
Abstract iv
目錄 vi
圖目錄 viii
表目錄 xi
第一章 緒論 1
第一節 前言 1
第二節 研究動機 1
第三節 研究目標與章節介紹 3
第二章 LED構造及基本原理 6
第一節 LED晶片發光原理 6
第二節 LED構造介紹及發展 9
第三節 色彩學 11
第四節 白光發光原理 19
第三章 加速壽命測試理論與資料分析 23
第一節 阿瑞尼斯 ( Arrhenius ) 方程 23
第二節 壽命分佈型態 24
第三節 最大概似法估算Weibull參數 27
第四節 Weubull 機率紙分佈法 28
第五節 平均壽命推算方式 29
第四章 加速壽命測試結果與討論 34
第一節 實驗方法與架構 34
第二節 玻璃螢光體燒結技術與特性 40
第一項 玻璃粉末與螢光粉末性質 40
第二項 玻璃螢光體燒結技術 42
第三節 可靠度規範 48
第四節 量測儀器與原理 53
第一項 高溫老化測試儀器 53
第二項 紫外光-可見光光譜儀 54
第三項 螢光光譜儀 56
第四項 生命週期光譜儀 58
第五項 積分球 60
第五節 矽膠螢光體與玻璃螢光體加速測試之量測與結果 62
第一項 流明衰減 62
第二項 色飄移 63
第三項 色溫差 63
第四項 穿透度衰減 65
第五項 激發與放光光譜 66
第六節 平均壽命預測計算 68
第五章 結論 75

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