| URN |
etd-0811109-143534 |
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| Author |
Li-Shen Chang |
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| Author's Email Address |
m963010126@student.nsysu.edu.tw |
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| Statistics |
This thesis had been viewed 4623 times. Download 1 times. |
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| Department |
Electrical Engineering |
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| Year |
2008 |
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| Semester |
2 |
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| Degree |
Master |
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| Type of Document |
|
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| Language |
English |
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| Title |
Comparator-Based Cyclic Analog-to-Digital Conversion with Error-Trimming |
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| Date of Defense |
2009-07-23 |
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| Page Count |
60 |
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| Keyword |
CBSC
error trimming
cyclic ADC
cyclic analog-to-digital
|
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| Abstract |
This thesis focuses on the analysis theory, circuit design, simulations, and chip measurements of the transfer stage in the continuously error-trimming comparator-based switched-capacitor charge transfer stage in the cyclic redundant-sign-digit (RSD) algorithm.
Capacitor mismatching remains an insurmountable factor for switched-capacitor circuit designers. To correct errors which result from the capacitor mismatching, a continuous error-trimming circuit is generalized from a typical CBSC circuit. The
analysis theory of the error-trimming operation describes the effects of the error-trimming circuit in the CBSC circuit, as well as the guidelines for trimming. The error-trimming operation is able to tune the gain and virtual condition of the charge transfer stage for canceling the gain and offset errors. The circuit is designed, with the 0.35μm 2-poly 4-metal TSMC process, in fully integral circuits. The circuit is
simulated by a matlab simulator and an online Cadence Spectre simulator, to confirm how the operation works. Finally, chip measurements are recorded for verification and simulation comparisons. |
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| Advisory Committee |
Jia-Jin Chen - chair
Tsang-Ling Hsu - co-chair
Jih-Ching Chiu - co-chair
Robert Rieger - advisor
|
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| Files |
indicate in-campus access in a year and off_campus not accessible |
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| Date of Submission |
2009-08-11 |
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