隨著高功率發光二極體(LEDs)元件發光效率與可靠度的提高，及LED照明大量被使用在日常生活中，LED研發重點由原先LED元件發展，已逐漸轉向LED模組構裝技術可靠度之研發，即研發LED模組材料、光功率、光場、結構設計和可靠度之間的關係。本論文研究共分三部份，在高溫老化測試下，首先研究LED模組透鏡形狀和失效可靠度相關性，然後研討LED模組光功率與光場衰減之機制，最後研究白光LED模組摻雜Ce:YAG 螢光膠之衰減機制。
第一部份研究為研討不同透鏡形狀高功率LED模組，在高溫老化測試下光功率及透鏡形狀之改變。實驗顯示出半球形塑膠透鏡模組，比圓柱形和橢圓形塑膠透鏡，有更好的壽命，這是由於半球形塑膠透鏡，有更好的熱散效果。同時在老化溫度80℃測試條件下，半球形透鏡LED模組的壽命，是圓柱形透鏡LED模組的1.5倍，也是橢圓形透鏡LED模組的3倍。
第二部份研究為研討LED模組光場與光譜在高溫老化實驗下，測試結果及衰減機制。實驗結果顯示LED模組的光場，在± (15o~75o)兩個不同的角度，相較於其他的角度，隨著老化時間增加有更多的衰減量。同時透鏡材料經由高溫老化後會產生衰退，使得LED模組中心波長在光譜中會產生5 nm的偏移。此外，隨著老化時間的增加，塑膠透鏡曲率半徑會有6-70 μm的收縮。進一步實驗與模擬結果顯示，改善透鏡的結構與材料，可以延長高功率LED模組的操作壽命。
第三部份研究為研討白光LED模組在高溫老化下，不同濃度與厚度摻雜Ce:YAG螢光膠的衰減機制。實驗結果顯示LED模組流明損失、色度CIE偏移、光譜強度減少，都隨著Ce:YAG的濃度增加而衰減。我們發現在1mm厚的螢光膠中，摻雜5.5％的Ce:YAG，是造成94%流明損失的原因，而剩餘的6％損失為矽膠衰退所產生。因此在LED模組封裝，低的Ce:YAG螢光粉摻雜濃度(2.4%)，調配厚度較薄的矽膠(1mm)，為白光LED模組掺雜螢光粉，延長操作壽命的必要條件。

Light-emitting diodes (LED) illumination takes considerable applications in nowadays daily lives due to the improvement on efficiency of the LED modules. The connections between the reliability and the lifetime, power efficiency, optical spectrum, and structure design of the LED modules are the major research topics.
In this study, high-power LED modules encapsulated with different lens shapes after a thermal-aging test were studied experimentally and numerically. The results showed that the LED modules encapsulated with a hemispherical-shaped plastic lens exhibited a better lifetime due to their better thermal dissipation than those with cylindrical- or elliptical-shaped plastic lenses. In the case of 80℃ aging test, the lifetime of hemispherical-shaped lens was 1.5 times better than the cylindrical- or elliptical-shaped lenses.
Decay of radiation pattern and optical spectrum of high-power LED modules fabricated by different manufacturers after a thermal-aging test were investigated experimentally and numerically. The results showed that the radiation pattern of the LED modules at the two view angles of ± (15o~75o) decreased more than the other angles as aging time increased. Due to the degradation of lens material after thermal aging, the center wavelength of the LED spectrum shifted 5 nm. Furthermore, the radius curvature of plastic lens was observed 6-70 μm contraction as aging times increased. Both experimental and simulated results clearly indicated that improving the lens structure and lens material is essential to extend the operating life of the high-power LED modules.
High-power phosphor-converted white-light-emitting diodes (PC-LEDs) with selected concentration and thickness of Ce:YAG phosphor-doped silicones were investigated to study the thermal degradation effect of the Ce:YAG phosphor-silicone layer. The experimental results showed that the lumen loss, chromaticity (CIE shift), and spectrum intensity reduction increased as the concentration of Ce:YAG phosphor doped silicone increased. We showed that 94% lumen loss was attributed to 5.5 wt% Ce:YAG doping and only 6% of the lumen loss was due to a 1mm thickness of silicone degradation. From practical points of view, we found that a lower doping concentration of the Ce:YAG phosphor in thin silicone is a better choice in terms of having less thermal degradation for use in packaging of the high-power PC-LEDs modules and is essential to extend the operating lifetime of the phosphor-based white LED modules.

中文摘要
英文摘要
誌 謝
內容目錄 I
圖目錄 V
表目錄 X
第一章 緒 論 1
1.1 前言 1
1.2 研究動機 1
1.3 文獻回顧 3
1.4 研究目標與章節介紹 6
1.5 參考文獻 7
第二章 LED構造及基本原理 10
2.1 LED 晶片發光原理 10
2.1.1 半導體基本原理 11
2.1.2 半導體之PN接合面 14
2.2 白光發光原理 17
2.2.1 LED白光發光方式 17
2.2.2 螢光粉發光原理 19
2.3 色彩學 23
2.3.1 光色度學簡論 24
2.3.2 光色度學顯色原理 27
2.4 幾何光學 37
2.4.1 基本幾何光學原理 37
2.4.2 模組幾何光路分析 39
2.5 LED構造介紹及發展 40
2.6 參考文獻 46
第三章 可靠度規範及儀器 49
3.1 可靠度測試規格 49
3.1.1 可靠度測試規範 49
3.1.2 可靠度失效率 54
3.2 儀器原理及說明 57
3.2.1 紫外光-可見光光譜原理 57
3.2.2 螢光光譜原理 59
3.2.3 螢光生命週期原理 62
3.2.4 視角機 64
3.2.5 積分球 67
3.3 參考文獻 70
第四章 高功率LED模組透鏡形狀和失效可靠度研究 73
4.1 實驗方法與架構 74
4.2 量測與結果 78
4.3 有限元素模擬與分析 78
4.4 結果與討論 80
4.4.1 模組實驗結果討論 80
4.4.2 有限元素分析結果討論 82
4.5 結論 87
4.6 參考文獻 89
第五章 高功率LED模組光功率與光場衰減機制研究 94
5.1 實驗方法與架構 95
5.2 量測與結果 99
5.3 光場模擬 102
5.4 結果與討論 103
5.4.1 模組實驗結果討論 103
5.4.2 光場模擬分析結果討論 111
5.4.3 光譜實驗結果討論 113
5.5 結論 115
5.6 參考文獻 116
第六章 高功率白光LED模組掺雜螢光膠衰減機制研究 117
6.1 實驗方法與架構 117
6.2 量測與結果 124
6.3 結果與討論 129
6.4 結論 135
6.5 參考文獻 137
第七章 結論與討論 140
7.1 結 論 140
7.2 未來可能研究方向 143
作者著作 147
作者簡介 149

第一章 緒 論
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第二章 LED構造及基本原理

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第四章 高功率LED模組透鏡形狀和失效可靠度研究

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第五章 高功率LED模組光功率與光場衰減機制研究

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第六章 高功率白光LED模組掺雜螢光膠衰減機制研究

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作 者 著 作
期刊論文：
1. Y. C. Hsu, Y. K. Lin, M. H. Chen, C. C. Tsai, J. H. Hiang, S. B. Huang, W. L. Hu, Y. I. Su, and W. H. Cheng, “Failure mechanisms associated with lens shape of high-power LED modules in Aging Test”, IEEE Transactions Electron Devices, vol. 55, no. 2, pp. 689-691, Feb. 2008.
2. C. C. Tsai, M. H. Chen, Y. C. Huang, Y. C. Hsu, Y. T Lo, Y. J. Lin, J. H. Kuang, S. B. Huang, H. L. Hu, Y. I. Su and W. H. Cheng, “Decay mechanisms of radiation pattern and optical spectrum of high-power LED modules in aging test”, IEEE Journal of Selected Topics in Quantum Electronics, vol. 15, no. 4, pp. 1156-1162, Jul./Aug. 2009.
3. C. C. Tsai, J. Wang, M. H. Chen, Y. C. Hsu, Y. J. Lin, C. W. Lee, S. B. Huang, H. L. Hu, and W. H. Cheng, “Investigation of Ce:YAG doping effect on thermal aging for high-power phosphor-converted White-Light-Emitting Diode”, IEEE Transactions Devices and Materials Reliability, vol. 9, no. 3, pp. 367-371, Sept. 2009.
4. C. C. Tsai, C. C. Huang, J. Wang, M. C. Hsuh, and W. H. Cheng, “An optimum design and fabrication of focus lens for high intensity Light-Emitting Diodes”, Japanese Journal of Applied Physics, vol. 48, no. 094504, Oct. 2009.

研討會論文:
1. C. C. Tsai, M. H. Chen, C. W Lee, Y. T. Lo, Y. C. Hsu, and W.H. Cheng, “Decay mechanisms of lumen and chromaticity for high-power phosphor-based white-light-emitting diodes in thermal aging”, Proceedings of SPIE, vol. 6910. Feb. 2008.
2. Y. C. Hsu, C. C. Tsai, M. H. Chen, Y. T. Lo, C. W. Lee, and W.H. Cheng, “Decay mechanisms of lumen and chromaticity for high-power phosphor-based white LED in thermal againg”, ECTC, May 27-30, Lake Buena Vista, Florida (2008).
3. C. Y. Cheng, Y. J. Lin, J. K. Chang, J. S. Wang, C. C. Tsai, C. W. Lee, H. L. Hu, and W. H. Cheng, “Effect of temperature and humidity on phosphor of concentration and efficiency”, Optics and Photonics Taiwan, Sat-P2-140, Taipei, Taiwan, 2008.
4. J. K. Chang, C. Y. Cheng, Y. J. Lin, C.C. Tsai, C. W. Lee, H. L. Hu, Y. C. Hsu, and W. H. Cheng, “The effect of high-power LED lens structure on the radiation patterns”, Optics and Photonics Taiwan, Sat-P2-290, Taipei, Taiwan, 2008.
5. Y. J. Lin, C. Y. Cheng, J. K. Chang, J. S. Wang, C. C. Tsai, C. W. Lee, H. L. Hu, and W. H. Cheng, “Characteristics and reliablity of red nitride phosphor used in White-Light Emitting Diodes”, Optics and Photonics Taiwan, Sat-P2-296, Taipei, Taiwan, 2008.
6. C. C. Tsai, Y. C. Hsu, M. H. Chen, Y. T. Lo, Y. J. Lin, J. H. Kuang, H. L. Hu, S. B. Huang, C. W. Lee, Y. I. Su, and W.H. Cheng, “Decay of radiation pattern and spectrum of hight-power LED modules in aging test”, IEEE Lasers & Elecrro-Optics Society (LEOS), B-FR-IV 4-2, Newport Beach, CA, USA, 2008.
7. J. S. Wang, C. C. Tsai, M. H. Chen, Y. C. Hsu, H. L. Hu, C. W Lee, and W.H. Cheng, “Decay of lumen and chromaticity of high-power phosphor-converted white-light-emitting diodes in thermal aging”, Proceedings of SPIE, vol. 7231. Feb. 2009.